![]() Arc-flash events rapidly release significant energy in a localized volume, where the electric arc experiences a reduction in resistance. These may lead to discontinuity between energized conductors, facilitating arcing events and fires. Arc-plasma discharges arise over time due to a variety of reliability issues related to cable material degradation, electrical and mechanical stresses or acute conductive wiring dislocations. While arc-faults are rare in electrical installations, many documented events have led to fires that resulted in significant damage to energy-generation, commercial and residential systems, as well as surrounding structures, in both the United States and abroad. This article provides guidance for electrode configuration selection and a sensitivity analysis for determining a reasonable engineering margin when actual dimension is not available. Using HCB as the worst-case scenario to determine the personal protection requirements may not be the best practice in all circumstances. According to the newly published model for IE estimation, the IE between vertical conductors inside a metal box (VCB) and horizontal conductors inside a metal box (HCB) can differ by a factor of two with other parameter constants. This article explains the fundamental theory on the selection of electrode configurations and performs more » sensitivity analysis of the enclosure dimension that have been introduced in the IEEE Std. ![]() The sensitivity and effect changes of other parameters have been discussed in the previous literatures. The parameters in the updated estimation models include electrode configuration, open circuit voltage, bolted fault current, arc duration, gap width, working distance, and enclosure dimension. ![]() 1584-2018 has added parameters for more accurate arc flash incident energy (IE), arcing current, and protection boundary estimation. = ,Īrc flash hazard prediction methods have become more sophisticated because the knowledge about arc flash phenomenon has advanced since the publication of IEEE Std.
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